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Test category modules covering all 24 edge case categories.

Modulesยง

c01_toolchain
Category 1: Toolchain, PTX, and SASS edge cases
c02_launch_config
Category 2: Kernel launch configuration edge cases
c03_pointer_bounds
Category 3: Pointer arithmetic, indexing, bounds edge cases
c04_address_space
Category 4: Address Space Correctness
c05_global_memory
Category 5: Global Memory Hazards
c06_shared_memory
Category 6: Shared Memory Edge Cases
c07_local_memory
Category 7: Local Memory and Stack
c08_synchronization
Category 8: Synchronization and Memory Ordering
c09_warp_level
Category 9: Warp-Level Programming
c10_block_grid
Category 10: Block and Grid Coordination
c11_control_flow
Category 11: Control Flow and Predication
c12_atomics
Category 12: Atomic Operations
c13_floating_point
Category 13: Floating-point edge cases
c14_integer
Category 14: Integer edge cases
c15_determinism
Category 15: Determinism and reproducibility
c16_async_pipeline
Category 16: Async copy and pipeline
c17_caching
Category 17: Caching and coherence
c18_host_device
Category 18: Host-device integration
c19_multi_stream
Category 19: Multi-stream concurrency
c20_multi_gpu
Category 20: Multi-GPU
c21_hardware
Category 21: Hardware reliability
c22_algorithms
Category 22: Algorithm-specific edge cases
c23_blind_spots
Category 23: Testing blind spots
c24_edge_matrix
Category 24: Edge case matrix
c25_float_filter
Category 25: Float filter predicate edge cases
g01_circuit_forward
Circuit forward kernel tests
g02_circuit_backward
Circuit backward kernel tests
g03_weight_injection
Weight injection pattern tests
g04_transfer_efficiency
Transfer efficiency tests
g05_circuit_cache
Circuit cache GPU integration tests
g06_ptx_robustness
PTX kernel robustness tests
g07_sat_cdcl
GPU CDCL SAT/UNSAT verifier tests
g08_device_counts
Device-resident row-count integrity tests.